IoT System Testing: An IoT Journey from Devices to Analytics and the Edge

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IoT System Testing: An IoT Journey from Devices to Analytics and the Edge
 

  • Author:Jon Duncan Hagar
  • Length: 345 pages
  • Edition: 1
  • Publisher: Apress
  • Publication Date: 2022-10-01
  • ISBN-10: 1484282752
  • ISBN-13: 9781484282755
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  • Buy Print:Buy from amazon


    Book Description

    To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another; this book considers the next explosion―of IoT―from a quality testing viewpoint. You’ll first gain an introduction to the Internet of Things (IoT), V&V, and testing. Next, you’ll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved; each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. What You Will Learn

    • Understand IoT software test architecture and planning
    • Master IoT security testing and test techniques
    • Study IoT test lab automation and architectures
    • Review the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V

    Who This Book Is ForReaders with basic knowledge of software development who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book.

    中文:

    书名:物联网系统测试:从设备到分析和边缘的物联网之旅

    要取得成功,团队必须确保物联网系统的质量。技术世界不断地从一个热门领域转移到另一个热门领域;本书从质量测试的角度考虑下一次物联网爆炸。您将首先了解物联网(IoT)、V&A;V和测试。接下来,您将了解整个生命周期的物联网测试规划和战略,包括数据分析和人工智能的影响。然后,您将更深入地研究物联网安全测试和各种测试技术、模式等。然后详细研究物联网软件测试实验室、体系结构、环境和人工智能。根据软件的关键程度和涉及的风险,有许多用于测试物联网质量的选项;每个选项都有积极和消极的影响,以及成本和进度影响。本书将引导初创企业和经验丰富的团队进入这些路径,并帮助您改进物联网系统的测试和质量评估。您将学到什么

    • 了解物联网软件测试体系结构和规划
    • 掌握物联网安全测试和测试技术
    • 研究物联网测试实验室自动化和架构
    • 使用测试和V&V评估对物联网安全、数据分析、人工智能、神经网络和可靠性的需求

    这本书是谁?希望更多了解物联网测试及其复杂性的具有软件开发基础知识的读者,以及进入物联网领域的公司,即使是那些已经深入物联网领域的人也将从这本书中受益。

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